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Beam Diagnostics |
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* Products List
- CCD Beam Profiler (BeamOn HR)
- Knife-Edge Beam Profiler (BeamAnalyzer)
- CCD Beam Profiler (BeamOn)
- Microscopic beam Analyzer (uBeam)
- M2 Measurement (M2 Beam)
- Beam Divergence Measurement (FOCUSGAGE)
- Goniometric Radiometer for fiber/diode (FiberAlyzer)
- Optical Beam Position/Power Measurement (SpotOn series)
- Large Aperture Beam Positoning System (SpotOn LA)
- AlignMeter
- Video Microscope Measurement on your PC (uVideoScope)
- Low Light Dual Mode Camera
- Resolving Collimator (TargetOn)
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There are three types of beam-profiling instrumentation:
CCD camera-based systems, knife-edge scanners, and slit
scanners.
CCD camera systems, suitable for pulsed or cw lasers,
instantly record and display the entire optical pattern
that impinges on the detector surface.
Knife-edge and slit profilers generate a calculated profile
by mechanically moving a slit aperture or knife-edge across
the beam. These systems provide better resolution than
CCD cameras, but the calculated profile makes more assumptions
about the beam shape. They are designed for use with cw
and high repetition-rate (e.g., >100 kHz) pulsed lasers. |
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 CCD Beam Profiler
- Complete system includes: CCD camera, PCI
card, ND 4.0 filtter, Software, Mounting block
- Silicon CCD Sensor: Array: 1360 x 1024, 4.65-mm
square pixels, Dimensions: 6.32 x 4.76mm
- Wavelength Range: 350 nm to 1150 nm
- Position Measurement: Range: 6.3(H)x4.7(V) mm,
Accuracy: < 1-㎛ processing accuracy
- Data Analysis: Pass/fail, average (up to 50 samples),
min., max., mean, standard deviation (up to 4096
samples),
Gaussian and top-hat percent fit |
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Scanning Slit Beam Profiler(Beam'R)
Beam'R is a versatile laser beam profiling system
for product development, QA and production assembly
and test. It provides orthogonal, two-dimensional
profiles of laser beams as small as 0.5 μm in diameter
and as large as 3 mm in diameter with four integrating
slits. Beam'R comprises a compact measurement head,
a single PC card and Windows 98, ME, NT, and 2000
compatible software. Detectors are available to
cover the range from 190 nm to 4 μm.
- Detector Wavelength Range: Silicon: 190 - 1175nm,
Indium Gallium Arsenide: 800-1750nm,
Indium Arsenide: 1000-3500 nm
- Display: x-y position, beam profile with zoom
for ×1 to ×32
- Measurement Analysis: Pass/Fail, running average
(2-100 samples), statistics (min., max., mean, standard
deviation) |
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Scanning Slit Beam Profiler(BeamScope)
The BeamScope™ is a versatile linear scanner
designed to measure beam diameters as small as 0.5
μm or as large as 25 mm. It features a unique retractable
probe that enables it to profile two orthogonal
axes simultaneously and then be removed completely
from the beam path. BeamScope heads are available
with silicon, germanium, and indium-arsenide detectors
that collectively cover the wavelength range from
190 nm to 4 μm.
- Measurements: cw or pulsed (>500 Hz) beam profile,
diameter, centroid, geometrical center, ellipticity,
beam
divergence
- Detector Wavelength Range: Silicon: 190 - 1100nm,
Indium Gallium Arsenide: 800-1800nm,
Indium Arsenide: 1500-4000nm, II-VI Detector: 4-12
μm
- Display: 2-dimensional profiles and 3-dimensional
reconstructions, pass/fail color indication on measured
parameters,
averages and standard deviations of measured parameters |
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Scanning Slit Beam Profiler(BeamMap)
The BeamMap™ is a complete laser-beam focusing,
diagnostic, alignment instrument for tightly focused
beams. It is ideal for product development, quality
assurance, and production assembly and testing.
Features include real-time x-y-z focus, angular
alignment, M2 (quality factor), and relative output
power, all in a single, compact measurement head.
- Detector Wavelength Range: Silicon: 190 - 1150nm,
Indium Gallium Arsenide: 800-1750nm
- Display: x-y position, focus, axial misalignment,
beam profile with zoom for ×1 to ×32
- Measurement Analysis: Pass/Fail, running average
(2-100 samples), statistics (min., max., mean, standard
deviation) |
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Scanning Slit Beam Profiler(BeamMap
ColliMate)
The new BeamMap ColliMate extends BeamMap profiler
technology to collimated beam measurement dramatically
simplifying the measurement of collimation and alignment
and the adjustment of multiple assemblies to the
same axes. In the collimate head, a rotating puck
carries x-y slit pairs in multiple planes spaced
along the z-axis (the direction of propagation).
- Detector Wavelength Range: Silicon: 190 - 1150nm,
Indium Gallium Arsenide: 800-1750nm
- Display Graphics: x-y profiles and centroid, 1×
to 16× zoom, M2, focus, divergence, pointing
- Measurement Analysis: Pass/Fail, running average
(2-100 samples), statistics (min., max., mean, standard
deviation) |
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Scanning Knife-Edge Profiler(BeamAlyzer
3-Blade Tomographic Profiler)
The three-blade scanning system is ideal for
scanning beams as small as 3 μm and as large as
5 mm. Like all scanning slit and knife-edge profilers,
to reconstruct three-dimensional beam profiles from
the two-dimensional data, it must make assumptions
about the beam. In many cases this is adequate,
but for the best three-dimensional reconstructions
available, the seven-blade detector heads are recommended.
No computer is required, but a monitor and mouse
is needed for 3 dimensional displays. Data may be
exported using the standard RS-232 or USB port.
- Detector Wavelength Range: Silicon: 400 - 1100nm,
UV Silicon: 190 - 1100nm, InGaAs: 800 - 1800nm
- Knife-Edge Apertures: 3 |
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Scanning Knife-Edge Profiler(Super
BeamAlyzer 7-Blade Tomographic Profiler)
The seven-blade SuperBeamAlyzer uses tomographic
reconstruction to develop the most accurate three-dimensional
intensity profiles possible from a scanning slit
or knife-edge profiler. The SuperBeamAlyzer measures
beams from 15μm to 9mm. No computer is required,
but a monitor and mouse is needed for 3 dimensional
displays. Data may be exported using the standard
RS-232 or USB port.
- Detector Wavelength Range: Silicon: 400 - 1100nm,
UV Silicon: 190 - 1100nm, InGaAs: 800 - 1800nm
- Knife-Edge Apertures: 7 |
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M2 Meter(BeamScope with
M2 Attachment)
The BeamScope™ is a versatile linear scanner
designed to measure beams as small as 0.5 μm in
diameter. When equipped with the optional M2 attachment
(13 SKD 611), it can determine the quality factor
of beams directly from a laser, and meets all of
the critera set forth by the International Standards
Organization for M2 measurement.
- Beam Diameter: 0.5 μm to 25 mm (depending on slit
configuration and head)
- Measurements: cw or pulsed (>3000 Hz) beam
profile, diameter, centroid, geometrical center,
ellipticity, beam
divergence
- Diameter Profiles: Gaussian, second moment, knife-edge,
and top hat
- Display: 2-dimensional profiles and 3-dimensional
reconstructions, pass/fail color indication on measured
parameters,
averages and standard deviations of measured parameters
- Detector Wavelength Range: Silicon: 190-1100nm,
Germanium: 800-1800nm, Indium-arsenide: 1500-4000nm,
II-VI Detector: 4-12 μm |
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BeamAnalyzer Accessories
(BeamAnalyzer Rotation Mount)
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BeamAnalyzer Accessories
(Fiber Adaptor) |
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